UBISTA - Unified Built-in Self Test Approach for Full Defect Testing
in Mixed Signal Devices
Coordinator: Dr. Ing. Hans Manhaeve, KHBO - IMEC Oostende, Belgium
Partners: Prof. Gaynor E. Taylor, MTU Leeds, U.K. Dr. Bedrich Weber, STU, Bratislava, Slovakia
Prof. Jaroslav Brzobohaty, TU Brno, Czech Republic Dr. Elena Gramatova, II SAS, Bratislava, Slovakia
Prof. Jeff Vanneuville, CEDO Brno, Czech Republic

       The project was focused on developing and demonstrating Built-In Self Test techniques for combined IDDQ and/or voltage testing. II SAS solved test pattern generation for digital part. One ATPG experimental system for specified CMOS defects (stuck-at, stuck-off, stuck-on and inside gate shorts) was developed and implemented. Results were presented at several international workshops and conferences.

Ubista meeting

    Final meeting in Bratislava